Automated orientation analysis of back-reflection X-ray Laue patterns. A system for indexing Laue spots and outputting stereographic projections by microcomputer

MLA

Sei Miura, et al. “Automated Orientation Analysis of Back-Reflection X-Ray Laue Patterns. A System for Indexing Laue Spots and Outputting Stereographic Projections by Microcomputer.” Journal of the Society of Materials Science, Japan, vol. 34, Jan. 1985, pp. 1105–09. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........88a507f20437caed72080ddfd7d5dfed&authtype=sso&custid=ns315887.

APA

Sei Miura, Satoshi Hashimoto, & Osamu Itoh. (1985). Automated orientation analysis of back-reflection X-ray Laue patterns. A system for indexing Laue spots and outputting stereographic projections by microcomputer. Journal of the Society of Materials Science, Japan, 34, 1105–1109.

Chicago

Sei Miura, Satoshi Hashimoto, and Osamu Itoh. 1985. “Automated Orientation Analysis of Back-Reflection X-Ray Laue Patterns. A System for Indexing Laue Spots and Outputting Stereographic Projections by Microcomputer.” Journal of the Society of Materials Science, Japan 34 (January): 1105–9. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........88a507f20437caed72080ddfd7d5dfed&authtype=sso&custid=ns315887.