Back to Search Start Over

GaAs Displacement Damage Dosimeter Based on Diode Dark Currents

Authors :
S.R. Messenger
Robert J. Walters
Ewart W. Blackmore
Michael Trinczek
Kenneth A. Clark
Nicolas J.-H. Roche
Mitchell F. Bennett
Cory D. Cress
Jeffrey H. Warner
Source :
IEEE Transactions on Nuclear Science. 62:2995-3002
Publication Year :
2015
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2015.

Abstract

GaAs diode dark currents are correlated over a very large proton energy range as a function of displacement damage dose (DDD). The linearity of the dark current increase with DDD over a wide range of applied voltage bias deems this device an excellent candidate for a DD dosimeter. Additional proton testing performed in situ enabled error estimate determination to within 10% for simulated space use.

Details

ISSN :
15581578 and 00189499
Volume :
62
Database :
OpenAIRE
Journal :
IEEE Transactions on Nuclear Science
Accession number :
edsair.doi...........827f844ebdfe616c12fca009aee11a4d