Cite
GaAs Displacement Damage Dosimeter Based on Diode Dark Currents
MLA
S.R. Messenger, et al. “GaAs Displacement Damage Dosimeter Based on Diode Dark Currents.” IEEE Transactions on Nuclear Science, vol. 62, Dec. 2015, pp. 2995–3002. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........827f844ebdfe616c12fca009aee11a4d&authtype=sso&custid=ns315887.
APA
S.R. Messenger, Robert J. Walters, Ewart W. Blackmore, Michael Trinczek, Kenneth A. Clark, Nicolas J.-H. Roche, Mitchell F. Bennett, Cory D. Cress, & Jeffrey H. Warner. (2015). GaAs Displacement Damage Dosimeter Based on Diode Dark Currents. IEEE Transactions on Nuclear Science, 62, 2995–3002.
Chicago
S.R. Messenger, Robert J. Walters, Ewart W. Blackmore, Michael Trinczek, Kenneth A. Clark, Nicolas J.-H. Roche, Mitchell F. Bennett, Cory D. Cress, and Jeffrey H. Warner. 2015. “GaAs Displacement Damage Dosimeter Based on Diode Dark Currents.” IEEE Transactions on Nuclear Science 62 (December): 2995–3002. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........827f844ebdfe616c12fca009aee11a4d&authtype=sso&custid=ns315887.