Microstructure and dielectric properties of Ba1−xSrxTiO3 films grown on LaAlO3 substrates

We report a systematic study of the microstructure and dielectric properties of barium strontium titanate, Ba1−xSrxTiO3, films grown by laser ablation on LaAlO3 substrates, where x=0.1–0.9 at an interval of 0.1. X-ray diffraction analysis shows that when x 0.4, compared with the peak temperatures of the bulk Ba1−xSrxTiO3. At room temperature, the dielectric constant and tunability are relatively high when x⩽0.4 but start to decrease rapidly as x increases.