Microstructure and dielectric properties of Ba1−xSrxTiO3 films grown on LaAlO3 substrates

MLA

T. Hudson, et al. “Microstructure and Dielectric Properties of Ba1−xSrxTiO3 Films Grown on LaAlO3 Substrates.” Applied Physics Letters, vol. 77, Aug. 2000, pp. 1200–02. EBSCOhost, https://doi.org/10.1063/1.1289272.

APA

T. Hudson, Q. X. Jia, Brady J. Gibbons, Y. Gim, Alp T. Findikoglu, C. Kwon, B. H. Park, & Y. Fan. (2000). Microstructure and dielectric properties of Ba1−xSrxTiO3 films grown on LaAlO3 substrates. Applied Physics Letters, 77, 1200–1202. https://doi.org/10.1063/1.1289272

Chicago

T. Hudson, Q. X. Jia, Brady J. Gibbons, Y. Gim, Alp T. Findikoglu, C. Kwon, B. H. Park, and Y. Fan. 2000. “Microstructure and Dielectric Properties of Ba1−xSrxTiO3 Films Grown on LaAlO3 Substrates.” Applied Physics Letters 77 (August): 1200–1202. doi:10.1063/1.1289272.