Buffer-Related Degradation Aspects of Single and Double-Heterostructure Quantum Well InAlN/GaN High-Electron-Mobility Transistors

We experimentally prove the viability of the concept of the double-heterostructure quantum well InAlN/GaN high-electron-mobility transistor (HEMT) for the device higher robustness and reliability. In the single quantum well InAlN/GaN HEMTs, the intrinsic channel resistance increases by 300% after 1 h off-state stress; much less degradation is observed in the double-heterostructure device with an AlGaN back barrier. Physics-based device simulation proves that the back barrier blocks the rate of carrier injection into the device buffer. However, whatever the quantum well design is, the energy of the injected electrons in the buffer of InAlN/GaN-based HEMTs is higher than that in the buffer of AlGaN/GaN HEMTs. This energy may be sufficient for releasing hydrogen from GaN point defects.