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Over Molding Process Development for a Stacked Wafer-level Chip Scale Package with Through Silicon Vias (TSVs)

Authors :
Iriguchi Shoichi
Yoshimi Takahashi
Philipp Steinmann
Yohei Koto
David C. Stepniak
Rajiv Dunne
Masazumi Amagai
Tom Bonifield
Source :
Transactions of The Japan Institute of Electronics Packaging. 5:122-131
Publication Year :
2012
Publisher :
Japan Institute of Electronics Packaging, 2012.

Details

ISSN :
18848028 and 18833365
Volume :
5
Database :
OpenAIRE
Journal :
Transactions of The Japan Institute of Electronics Packaging
Accession number :
edsair.doi...........6c35b1c8da46e59d231586edac967e44