Back to Search Start Over

Electrical Investigation of Deep-Level Defects Introduced in AlGaN/GaN Heterostructures by CF4 Plasma Treatments

Authors :
Masahito Niibe
Yoshitaka Nakano
Retsuo Kawakami
Tatsuo Shirahama
Takashi Mukai
Source :
ECS Solid State Letters. 4:P36-P38
Publication Year :
2015
Publisher :
The Electrochemical Society, 2015.

Details

ISSN :
21628750 and 21628742
Volume :
4
Database :
OpenAIRE
Journal :
ECS Solid State Letters
Accession number :
edsair.doi...........27158fc7e9a68cba207106506f8493c8
Full Text :
https://doi.org/10.1149/2.0011505ssl