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Solid-state electrochemical nanoimprinting of copper

Authors :
Nicholas X. Fang
Keng Hsu
Peter L. Schultz
Placid M. Ferreira
Source :
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 25:2419
Publication Year :
2007
Publisher :
American Vacuum Society, 2007.

Abstract

For the first time, the authors report highly selective dry etching of copper with a resolution of 80nm using solid-state electrochemical nanoimprint technology. By exploiting the high mobility of copper ions in solid electrolytes such as copper sulfide, they are able to obtain etching rates up to 5A∕s without the use of contaminating liquids and excessive mechanical forces. Given the dearth of dry etch processes for metals in general and the fact that nanopatterning of metals is typically achieved indirectly using multistep processes, such a direct patterning technique offers potential application in a number of process steps in metallic interconnects and other nanoscale device fabrication.

Details

ISSN :
10711023
Volume :
25
Database :
OpenAIRE
Journal :
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Accession number :
edsair.doi...........15cbfd9200a44405950448f54090dc02
Full Text :
https://doi.org/10.1116/1.2799977