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Influence of internal semiconductor processes on errors at measurement of thermal resistance

Authors :
Chen, W.
Deng, E.
Josef Lutz
Basler, T.
Source :
Scopus-Elsevier

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier
Accession number :
edsair.dedup.wf.001..bd722933177b21072c1bf19b5a94033c

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