Influence of internal semiconductor processes on errors at measurement of thermal resistance

MLA

Chen, W., et al. Influence of Internal Semiconductor Processes on Errors at Measurement of Thermal Resistance. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.dedup.wf.001..bd722933177b21072c1bf19b5a94033c&authtype=sso&custid=ns315887. Accessed 13 Jan. 2025.

APA

Chen, W., Deng, E., Josef Lutz, & Basler, T. (n.d.). Influence of internal semiconductor processes on errors at measurement of thermal resistance.

Chicago

Chen, W., E. Deng, Josef Lutz, and T. Basler. 2025. “Influence of Internal Semiconductor Processes on Errors at Measurement of Thermal Resistance.” Accessed January 13. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.dedup.wf.001..bd722933177b21072c1bf19b5a94033c&authtype=sso&custid=ns315887.