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Low Cost BIST for Static and Dynamic Testing of ADCs
- Source :
- Journal of Electronic Testing; June 2005, Vol. 21 Issue: 3 p283-290, 8p
- Publication Year :
- 2005
-
Abstract
- Abstract This paper presents a low cost test method for the static and dynamic characterization of analog-to-digital converters. The method is suitable for implementation in a SoC environment, as a built-in self test (BIST) solution. In the proposed approach, noise is used as the test signal. Theory of operation and practical results demonstrating the effectiveness of the method for INL, DNL, THD and SINAD characterization are presented. The BIST surface overhead caused by the noise generator is only 7.4% of the ADC total area. The reduced number of data samples required allows a reduction of about 7.5× in test time, in comparison to the histogram method.
Details
- Language :
- English
- ISSN :
- 09238174 and 15730727
- Volume :
- 21
- Issue :
- 3
- Database :
- Supplemental Index
- Journal :
- Journal of Electronic Testing
- Publication Type :
- Periodical
- Accession number :
- ejs7010893
- Full Text :
- https://doi.org/10.1007/s10836-005-6357-5