Cite
Low Cost BIST for Static and Dynamic Testing of ADCs
MLA
Da Gloria Flores, Maria, et al. “Low Cost BIST for Static and Dynamic Testing of ADCs.” Journal of Electronic Testing, vol. 21, no. 3, June 2005, pp. 283–90. EBSCOhost, https://doi.org/10.1007/s10836-005-6357-5.
APA
Da Gloria Flores, M., Negreiros, M., Carro, L., Susin, A. A., Clayton, F. R., & Benevento, C. (2005). Low Cost BIST for Static and Dynamic Testing of ADCs. Journal of Electronic Testing, 21(3), 283–290. https://doi.org/10.1007/s10836-005-6357-5
Chicago
Da Gloria Flores, Maria, Marcelo Negreiros, Luigi Carro, Altamiro A. Susin, Felipe R. Clayton, and Cristiano Benevento. 2005. “Low Cost BIST for Static and Dynamic Testing of ADCs.” Journal of Electronic Testing 21 (3): 283–90. doi:10.1007/s10836-005-6357-5.