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High-NA mask phase-effects studied by AIMS EUV

Authors :
Burkhardt, Martin
van Lare, Claire
Roesch, Matthias
Kersteen, Grizelda
Verch, Andreas
Albert, Maximilian
Heringlake, Philip
Gwosch, Klaus
Capelli, Renzo
Source :
Proceedings of SPIE; April 2024, Vol. 12953 Issue: 1 p129531F-129531F-7, 1165787p
Publication Year :
2024

Details

Language :
English
ISSN :
0277786X
Volume :
12953
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs66172049
Full Text :
https://doi.org/10.1117/12.3010001