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SEMI-CenterNet: a machine learning facilitated approach for semiconductor defect inspection
- Source :
- Proceedings of SPIE; October 2023, Vol. 12802 Issue: 1 p128020M-128020M-9, 1152190p
- Publication Year :
- 2023
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 12802
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs64146576
- Full Text :
- https://doi.org/10.1117/12.2675570