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Monolithic silicon avalanche photodetector utilizing surface state defects operating at 1550 nm

Authors :
Reed, Graham T.
Knights, Andrew P.
Gao, Yuxuan
Guo, Feng
Mascher, Peter
Knights, Andrew P.
Source :
Proceedings of SPIE; March 2023, Vol. 12426 Issue: 1 p1242609-1242609-5
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12426
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs62972554
Full Text :
https://doi.org/10.1117/12.2651724