Monolithic silicon avalanche photodetector utilizing surface state defects operating at 1550 nm

MLA

Reed, Graham T., et al. “Monolithic Silicon Avalanche Photodetector Utilizing Surface State Defects Operating at 1550 Nm.” Proceedings of SPIE, vol. 12426, no. 1, Mar. 2023, pp. 1242609-1242609–5. EBSCOhost, https://doi.org/10.1117/12.2651724.

APA

Reed, G. T., Knights, A. P., Gao, Y., Guo, F., Mascher, P., & Knights, A. P. (2023). Monolithic silicon avalanche photodetector utilizing surface state defects operating at 1550 nm. Proceedings of SPIE, 12426(1), 1242609-1242609–5. https://doi.org/10.1117/12.2651724

Chicago

Reed, Graham T., Andrew P. Knights, Yuxuan Gao, Feng Guo, Peter Mascher, and Andrew P. Knights. 2023. “Monolithic Silicon Avalanche Photodetector Utilizing Surface State Defects Operating at 1550 Nm.” Proceedings of SPIE 12426 (1): 1242609-1242609–5. doi:10.1117/12.2651724.