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Mobilty Modeling of Strained Germanium (s-Ge) Quantum Well (QW) Heterostructure pMOSFETs
- Source :
- ECS Transactions; October 2008, Vol. 16 Issue: 10
- Publication Year :
- 2008
-
Abstract
- In this work, we have performed a thorough study of the mobility in 'Si / s-Ge / Si' QW heterostructure pMOSFETs. Through experiments and detailed simulations, the effects of the s-Ge quantum well (QW) thickness and quantum confinement effects on the hole mobility of both, single-gate (SG) and double-gate (DG) QW pMOSFETs have been explored.
Details
- Language :
- English
- ISSN :
- 19385862 and 19386737
- Volume :
- 16
- Issue :
- 10
- Database :
- Supplemental Index
- Journal :
- ECS Transactions
- Publication Type :
- Periodical
- Accession number :
- ejs61746994
- Full Text :
- https://doi.org/10.1149/1.2986797