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Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes
- Source :
- Proceedings of SPIE; May 2015, Vol. 9529 Issue: 1 p95290W-95290W-5, 857616p
- Publication Year :
- 2015
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 9529
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs36363525
- Full Text :
- https://doi.org/10.1117/12.2184850