Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes

MLA

Ferraro, Pietro, et al. “Multiple Angle of Incidence, Spectroscopic, Plasmon-Enhanced, Internal Reflection Ellipsometry for the Characterization of Solid-Liquid Interface Processes.” Proceedings of SPIE, vol. 9529, no. 1, May 2015, p. 95290W–95290W–5. EBSCOhost, https://doi.org/10.1117/12.2184850.

APA

Ferraro, P., Grilli, S., Ritsch-Marte, M., Stifter, D., Petrik, P., Agocs, E., Kalas, B., Kozma, P., Fodor, B., Nador, J., Major, C., & Fried, M. (2015). Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. Proceedings of SPIE, 9529(1), 95290W–95290W–5. https://doi.org/10.1117/12.2184850

Chicago

Ferraro, Pietro, Simonetta Grilli, Monika Ritsch-Marte, David Stifter, P. Petrik, E. Agocs, B. Kalas, et al. 2015. “Multiple Angle of Incidence, Spectroscopic, Plasmon-Enhanced, Internal Reflection Ellipsometry for the Characterization of Solid-Liquid Interface Processes.” Proceedings of SPIE 9529 (1): 95290W–95290W–5. doi:10.1117/12.2184850.