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An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging
- Source :
- Ultramicroscopy; 1997, Vol. 69 Issue: 2 p83-104, 22p
- Publication Year :
- 1997
Details
- Language :
- English
- ISSN :
- 03043991
- Volume :
- 69
- Issue :
- 2
- Database :
- Supplemental Index
- Journal :
- Ultramicroscopy
- Publication Type :
- Periodical
- Accession number :
- ejs3118888
- Full Text :
- https://doi.org/10.1016/S0304-3991(97)00041-7