Cite
An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging
MLA
Anderson, S. C., et al. “An Approach to Quantitative Compositional Profiling at Near-Atomic Resolution Using High-Angle Annular Dark Field Imaging.” Ultramicroscopy, vol. 69, no. 2, Jan. 1997, pp. 83–104. EBSCOhost, https://doi.org/10.1016/S0304-3991(97)00041-7.
APA
Anderson, S. C., Birkeland, C. R., Anstis, G. R., & Cockayne, D. J. H. (1997). An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging. Ultramicroscopy, 69(2), 83–104. https://doi.org/10.1016/S0304-3991(97)00041-7
Chicago
Anderson, S. C., C. R. Birkeland, G. R. Anstis, and D. J. H. Cockayne. 1997. “An Approach to Quantitative Compositional Profiling at Near-Atomic Resolution Using High-Angle Annular Dark Field Imaging.” Ultramicroscopy 69 (2): 83–104. doi:10.1016/S0304-3991(97)00041-7.