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Determination of silicon in nickel-based alloys using electrothermal atomic absorption spectrometry with longitudinal Zeeman-effect background correction and zinc oxide pretreatment
- Source :
- Analytica Chimica Acta; 2001, Vol. 435 Issue: 2 p357-366, 10p
- Publication Year :
- 2001
Details
- Language :
- English
- ISSN :
- 00032670 and 18734324
- Volume :
- 435
- Issue :
- 2
- Database :
- Supplemental Index
- Journal :
- Analytica Chimica Acta
- Publication Type :
- Periodical
- Accession number :
- ejs2383244
- Full Text :
- https://doi.org/10.1016/S0003-2670(01)00855-8