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Determination of silicon in nickel-based alloys using electrothermal atomic absorption spectrometry with longitudinal Zeeman-effect background correction and zinc oxide pretreatment

Authors :
Chen, S. Y.
Wu, M. S.
Tsai, S. J.
Source :
Analytica Chimica Acta; 2001, Vol. 435 Issue: 2 p357-366, 10p
Publication Year :
2001

Details

Language :
English
ISSN :
00032670 and 18734324
Volume :
435
Issue :
2
Database :
Supplemental Index
Journal :
Analytica Chimica Acta
Publication Type :
Periodical
Accession number :
ejs2383244
Full Text :
https://doi.org/10.1016/S0003-2670(01)00855-8