Determination of silicon in nickel-based alloys using electrothermal atomic absorption spectrometry with longitudinal Zeeman-effect background correction and zinc oxide pretreatment

MLA

Chen, S. Y., et al. “Determination of Silicon in Nickel-Based Alloys Using Electrothermal Atomic Absorption Spectrometry with Longitudinal Zeeman-Effect Background Correction and Zinc Oxide Pretreatment.” Analytica Chimica Acta, vol. 435, no. 2, Jan. 2001, pp. 357–66. EBSCOhost, https://doi.org/10.1016/S0003-2670(01)00855-8.

APA

Chen, S. Y., Wu, M. S., & Tsai, S. J. (2001). Determination of silicon in nickel-based alloys using electrothermal atomic absorption spectrometry with longitudinal Zeeman-effect background correction and zinc oxide pretreatment. Analytica Chimica Acta, 435(2), 357–366. https://doi.org/10.1016/S0003-2670(01)00855-8

Chicago

Chen, S. Y., M. S. Wu, and S. J. Tsai. 2001. “Determination of Silicon in Nickel-Based Alloys Using Electrothermal Atomic Absorption Spectrometry with Longitudinal Zeeman-Effect Background Correction and Zinc Oxide Pretreatment.” Analytica Chimica Acta 435 (2): 357–66. doi:10.1016/S0003-2670(01)00855-8.