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Guest Editorial

Authors :
Nikolos, Dimitris
Hayes, John
Nicolaidis, Michael
Metra, Cecilia
Source :
Journal of Electronic Testing; June 2002, Vol. 18 Issue: 3 p259-260, 2p
Publication Year :
2002

Details

Language :
English
ISSN :
09238174 and 15730727
Volume :
18
Issue :
3
Database :
Supplemental Index
Journal :
Journal of Electronic Testing
Publication Type :
Periodical
Accession number :
ejs2129494
Full Text :
https://doi.org/10.1023/A:1015084620442