Guest Editorial

MLA

Nikolos, Dimitris, et al. “Guest Editorial.” Journal of Electronic Testing, vol. 18, no. 3, June 2002, pp. 259–60. EBSCOhost, https://doi.org/10.1023/A:1015084620442.

APA

Nikolos, D., Hayes, J., Nicolaidis, M., & Metra, C. (2002). Guest Editorial. Journal of Electronic Testing, 18(3), 259–260. https://doi.org/10.1023/A:1015084620442

Chicago

Nikolos, Dimitris, John Hayes, Michael Nicolaidis, and Cecilia Metra. 2002. “Guest Editorial.” Journal of Electronic Testing 18 (3): 259–60. doi:10.1023/A:1015084620442.