Back to Search Start Over

Module Optical Analyzer: Identification Of Defects On The Production Line.

Authors :
Herrero, Rebeca
Askins, Stephen
Antón, Ignacio
Sala, Gabriel
Araki, Kenji
Nagai, Hirokazu
Source :
AIP Conference Proceedings; 2014, Vol. 1616, p119-123, 5p, 2 Diagrams, 1 Chart, 2 Graphs
Publication Year :
2014

Abstract

The usefulness of the module optical analyzer when identifying module defects on production line is presented in this paper. Two different case studies performed with two different kind of CPV modules are presented to show the use of MOA both in IES-UPM and Daido Steel facilities. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
1616
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
98606819
Full Text :
https://doi.org/10.1063/1.4897042