Module Optical Analyzer: Identification Of Defects On The Production Line.

MLA

Herrero, Rebeca, et al. “Module Optical Analyzer: Identification Of Defects On The Production Line.” AIP Conference Proceedings, vol. 1616, Sept. 2014, pp. 119–23. EBSCOhost, https://doi.org/10.1063/1.4897042.

APA

Herrero, R., Askins, S., Antón, I., Sala, G., Araki, K., & Nagai, H. (2014). Module Optical Analyzer: Identification Of Defects On The Production Line. AIP Conference Proceedings, 1616, 119–123. https://doi.org/10.1063/1.4897042

Chicago

Herrero, Rebeca, Stephen Askins, Ignacio Antón, Gabriel Sala, Kenji Araki, and Hirokazu Nagai. 2014. “Module Optical Analyzer: Identification Of Defects On The Production Line.” AIP Conference Proceedings 1616 (September): 119–23. doi:10.1063/1.4897042.