A 4K CMOS gate array with automatically generated test circuits.

Details

Language :

English

ISSN :

00189200

Volume :

20

Issue :

5

Database :

Complementary Index

Journal :

IEEE Journal of Solid-State Circuits

Publication Type :

Academic Journal

Accession number :

92811406

Full Text :

https://doi.org/10.1109/JSSC.1985.1052430