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High fill factor and progressive scan PtSi Schottky-barrier IR-CCD image sensor having new wiring structure over photodiodes.

Authors :
Tohyama, S.
Masubuchi, K.
Konuma, K.
Azuma, H.
Tanabe, A.
Utsumi, H.
Teranishi, N.
Takano, E.
Yamagata, S.
Hijikawa, M.
Sahara, H.
Muramatsu, T.
Seki, T.
Ono, T.
Goto, H.
Source :
Proceedings of IEEE International Electron Devices Meeting; 1993, p183-186, 4p
Publication Year :
1993

Details

Language :
English
ISBNs :
9780780314504
Database :
Complementary Index
Journal :
Proceedings of IEEE International Electron Devices Meeting
Publication Type :
Conference
Accession number :
92489537
Full Text :
https://doi.org/10.1109/IEDM.1993.347370