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Modeling arsenic activation and diffusion during furnace and rapid thermal annealing.

Authors :
Vandenbossche, E.
Jaouen, H.
Baccus, B.
Source :
Proceedings of International Electron Devices Meeting; 1995, p81-84, 4p
Publication Year :
1995

Details

Language :
English
ISBNs :
9780780327009
Database :
Complementary Index
Journal :
Proceedings of International Electron Devices Meeting
Publication Type :
Conference
Accession number :
92448781
Full Text :
https://doi.org/10.1109/IEDM.1995.497187