Efficient path selection for delay testing based on partial path evaluation.

Details

Language :

English

ISBNs :

9780818684364

Database :

Complementary Index

Journal :

Proceedings 16th IEEE VLSI Test Symposium (Cat No98TB100231)

Publication Type :

Conference

Accession number :

92213402

Full Text :

https://doi.org/10.1109/VTEST.1998.670867