Correlation of logical failures to a suspect process step.

Authors :: Balachandran, H.
Parker, J.
Shupp, D.
Butler, S.
Butler, K.M.
Force, C.
Smith, J.
Source :: International Test Conference 1999 Proceedings (IEEE Cat No99CH37034); 1999, p458-466, 9p
Publication Year :: 1999

Language :: English
ISBNs :: 9780780357532
Database :: Complementary Index
Journal :: International Test Conference 1999 Proceedings (IEEE Cat No99CH37034)
Publication Type :: Conference
Accession number :: 92191331
Full Text :: https://doi.org/10.1109/TEST.1999.805768