Cite

Correlation of logical failures to a suspect process step.

MLA

Balachandran, H., et al. “Correlation of Logical Failures to a Suspect Process Step.” International Test Conference 1999 Proceedings (IEEE Cat No99CH37034), Jan. 1999, pp. 458–66. EBSCOhost, https://doi.org/10.1109/TEST.1999.805768.



APA

Balachandran, H., Parker, J., Shupp, D., Butler, S., Butler, K. M., Force, C., & Smith, J. (1999). Correlation of logical failures to a suspect process step. International Test Conference 1999 Proceedings (IEEE Cat No99CH37034), 458–466. https://doi.org/10.1109/TEST.1999.805768



Chicago

Balachandran, H., J. Parker, D. Shupp, S. Butler, K.M. Butler, C. Force, and J. Smith. 1999. “Correlation of Logical Failures to a Suspect Process Step.” International Test Conference 1999 Proceedings (IEEE Cat No99CH37034), January, 458–66. doi:10.1109/TEST.1999.805768.