Total dose behavior of partially depleted SOI dynamic threshold voltage MOS (DTMOS) for very low supply voltage applications (0.6-1 V).

Details

Language :

English

ISBNs :

9780780357266

Database :

Complementary Index

Journal :

1999 Fifth European Conference on Radiation & Its Effects on Components & Systems RADECS 99 (Cat No99TH8471)

Publication Type :

Conference

Accession number :

92132623

Full Text :

https://doi.org/10.1109/RADECS.1999.858600