Back to Search Start Over

Failure mechanism of hole formation in laser welding technique for optoelectronic packaging.

Authors :
Cheng, W.H.
Wang, W.H.
Huang, Y.M.
Chen, H.Y.
Lin, H.H.
Source :
1995 Proceedings 45th Electronic Components & Technology Conference; 1995, p914-916, 3p
Publication Year :
1995

Details

Language :
English
ISBNs :
9780780327368
Database :
Complementary Index
Journal :
1995 Proceedings 45th Electronic Components & Technology Conference
Publication Type :
Conference
Accession number :
92107782
Full Text :
https://doi.org/10.1109/ECTC.1995.517798