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The analysis on the origin of high resistivity in Cl-doped polycrystalline CdZnTe thick films.

Authors :
Kim, K. H.
Park, Y. J.
Na, Y. H.
Hong, J. K.
Jung, T. R.
Yi, Y.
Kim, S. U.
Source :
Physica Status Solidi (C); 2004, Vol. 1 Issue 4, p743-746, 4p
Publication Year :
2004

Details

Language :
English
ISSN :
18626351
Volume :
1
Issue :
4
Database :
Complementary Index
Journal :
Physica Status Solidi (C)
Publication Type :
Academic Journal
Accession number :
91036277
Full Text :
https://doi.org/10.1002/pssc.200304289