The analysis on the origin of high resistivity in Cl-doped polycrystalline CdZnTe thick films.

MLA

Kim, K. H., et al. “The Analysis on the Origin of High Resistivity in Cl-Doped Polycrystalline CdZnTe Thick Films.” Physica Status Solidi (C), vol. 1, no. 4, Mar. 2004, pp. 743–46. EBSCOhost, https://doi.org/10.1002/pssc.200304289.

APA

Kim, K. H., Park, Y. J., Na, Y. H., Hong, J. K., Jung, T. R., Yi, Y., & Kim, S. U. (2004). The analysis on the origin of high resistivity in Cl-doped polycrystalline CdZnTe thick films. Physica Status Solidi (C), 1(4), 743–746. https://doi.org/10.1002/pssc.200304289

Chicago

Kim, K. H., Y. J. Park, Y. H. Na, J. K. Hong, T. R. Jung, Y. Yi, and S. U. Kim. 2004. “The Analysis on the Origin of High Resistivity in Cl-Doped Polycrystalline CdZnTe Thick Films.” Physica Status Solidi (C) 1 (4): 743–46. doi:10.1002/pssc.200304289.