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CULT: A unified framework for tracing and logging C-based designs.

Authors :
Hong, Wei
Viehl, Alexander
Bannow, Nico
Kerstan, Christian
Post, Hendrik
Bringmann, Oliver
Rosenstiel, Wolfgang
Source :
Proceedings of the 2012 System, Software, SoC & Silicon Debug Conference; 1/ 1/2012, p1-6, 6p
Publication Year :
2012

Abstract

This paper presents a novel framework for tracing and logging C-based designs of embedded hardware/software systems. The development of this C-based Unified Logging and Tracing (CULT) framework was driven by the necessity of a common development support environment between different design disciplines and at different early design phases in which development takes place using C-based languages (C/C++/SystemC). The elaborated framework is highly configurable and scalable. It requires only minimal code changes in order to be used and it implements enhanced features as a dynamic configurable history and backtracking of signals and values. Further, we demonstrate the interconnection with assertion-based verification (ABV) in order to support design testing and validation in early design phases. The framework will be released as open-source project for establishing a vital community and for building up a tooling landscape around the basic capabilities. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISBNs :
9781467324540
Database :
Complementary Index
Journal :
Proceedings of the 2012 System, Software, SoC & Silicon Debug Conference
Publication Type :
Conference
Accession number :
86627132