CULT: A unified framework for tracing and logging C-based designs.

MLA

Hong, Wei, et al. “CULT: A Unified Framework for Tracing and Logging C-Based Designs.” Proceedings of the 2012 System, Software, SoC & Silicon Debug Conference, Jan. 2012, pp. 1–6. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edb&AN=86627132&authtype=sso&custid=ns315887.

APA

Hong, W., Viehl, A., Bannow, N., Kerstan, C., Post, H., Bringmann, O., & Rosenstiel, W. (2012). CULT: A unified framework for tracing and logging C-based designs. Proceedings of the 2012 System, Software, SoC & Silicon Debug Conference, 1–6.

Chicago

Hong, Wei, Alexander Viehl, Nico Bannow, Christian Kerstan, Hendrik Post, Oliver Bringmann, and Wolfgang Rosenstiel. 2012. “CULT: A Unified Framework for Tracing and Logging C-Based Designs.” Proceedings of the 2012 System, Software, SoC & Silicon Debug Conference, January, 1–6. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edb&AN=86627132&authtype=sso&custid=ns315887.