Deep-level effects on slow current transients and current collapse in GaN MESFETs.

Details

Language :

English

ISBNs :

9780780386686

Database :

Complementary Index

Journal :

13th International Conference on Semiconducting & Insulating Materials, 2004. SIMC-XIII-2004

Publication Type :

Conference

Accession number :

82088126

Full Text :

https://doi.org/10.1109/SIM.2005.1511434