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Charge storage characteristics in Ge/Si hetero-nanocrystals based MOS memory structure.
- Source :
- 2001 6th International Conference on Solid-State & Integrated Circuit Technology. Proceedings (Cat. No.01EX443); 2001, p1418-1418, 1p
- Publication Year :
- 2001
Details
- Language :
- English
- ISBNs :
- 9780780365209
- Database :
- Complementary Index
- Journal :
- 2001 6th International Conference on Solid-State & Integrated Circuit Technology. Proceedings (Cat. No.01EX443)
- Publication Type :
- Conference
- Accession number :
- 81904057
- Full Text :
- https://doi.org/10.1109/ICSICT.2001.982169