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Analysis of software test item generation - comparison between high skilled and low skilled engineers.

Authors :
Hirayama, M.
Yamamoto, T.
Mizuno, O.
Kikuno, T.
Source :
Test Symposium, 2003. ATS 2003. 12th Asian; 2003, p210-215, 6p
Publication Year :
2003

Details

Language :
English
ISBNs :
9780769519517
Database :
Complementary Index
Journal :
Test Symposium, 2003. ATS 2003. 12th Asian
Publication Type :
Conference
Accession number :
81287547
Full Text :
https://doi.org/10.1109/ATS.2003.1250811