Analysis of software test item generation - comparison between high skilled and low skilled engineers.

MLA

Hirayama, M., et al. “Analysis of Software Test Item Generation - Comparison between High Skilled and Low Skilled Engineers.” Test Symposium, 2003. ATS 2003. 12th Asian, Jan. 2003, pp. 210–15. EBSCOhost, https://doi.org/10.1109/ATS.2003.1250811.

APA

Hirayama, M., Yamamoto, T., Mizuno, O., & Kikuno, T. (2003). Analysis of software test item generation - comparison between high skilled and low skilled engineers. Test Symposium, 2003. ATS 2003. 12th Asian, 210–215. https://doi.org/10.1109/ATS.2003.1250811

Chicago

Hirayama, M., T. Yamamoto, O. Mizuno, and T. Kikuno. 2003. “Analysis of Software Test Item Generation - Comparison between High Skilled and Low Skilled Engineers.” Test Symposium, 2003. ATS 2003. 12th Asian, January, 210–15. doi:10.1109/ATS.2003.1250811.