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Impact of gate misalignment on the performance of dopant-segregated Schottky Barrier MOSFETs.

Authors :
Lang Zeng
Xiao Yan Liu
Gang Du
Jin Feng Kang
Ru Qi Han
Source :
2008 9th International Conference on Solid-State & Integrated-Circuit Technology; 2008, p504-507, 4p
Publication Year :
2008

Details

Language :
English
ISBNs :
9781424421855
Database :
Complementary Index
Journal :
2008 9th International Conference on Solid-State & Integrated-Circuit Technology
Publication Type :
Conference
Accession number :
80988523
Full Text :
https://doi.org/10.1109/ICSICT.2008.4734574