Evaluation of SCR-Based ESD Protection Devices in 90nm and 65nm CMOS Technologies.

Details

Language :

English

ISBNs :

9781424409198

Database :

Complementary Index

Journal :

2007 IEEE International Reliability Physics Symposium Proceedings 45th Annual

Publication Type :

Conference

Accession number :

80911760

Full Text :

https://doi.org/10.1109/RELPHY.2007.369914