Cite
Evaluation of SCR-Based ESD Protection Devices in 90nm and 65nm CMOS Technologies.
MLA
Di Sarro, J., et al. “Evaluation of SCR-Based ESD Protection Devices in 90nm and 65nm CMOS Technologies.” 2007 IEEE International Reliability Physics Symposium Proceedings 45th Annual, Jan. 2007, pp. 348–57. EBSCOhost, https://doi.org/10.1109/RELPHY.2007.369914.
APA
Di Sarro, J., Chatty, K., Gauthier, R., & Rosenbaum, E. (2007). Evaluation of SCR-Based ESD Protection Devices in 90nm and 65nm CMOS Technologies. 2007 IEEE International Reliability Physics Symposium Proceedings 45th Annual, 348–357. https://doi.org/10.1109/RELPHY.2007.369914
Chicago
Di Sarro, J., K. Chatty, R. Gauthier, and E. Rosenbaum. 2007. “Evaluation of SCR-Based ESD Protection Devices in 90nm and 65nm CMOS Technologies.” 2007 IEEE International Reliability Physics Symposium Proceedings 45th Annual, January, 348–57. doi:10.1109/RELPHY.2007.369914.