Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35μm Triple-Well Process.

Details

Language :

English

ISBNs :

9781424406388

Database :

Complementary Index

Journal :

2006 IEEE Radiation Effects Data Workshop

Publication Type :

Conference

Accession number :

80841931

Full Text :

https://doi.org/10.1109/REDW.2006.295474