Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35μm Triple-Well Process.

MLA

Hartwell, M., et al. “Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35μm Triple-Well Process.” 2006 IEEE Radiation Effects Data Workshop, Jan. 2006, pp. 94–100. EBSCOhost, https://doi.org/10.1109/REDW.2006.295474.

APA

Hartwell, M., Ryan, K., Netherton, S., Milliken, P., & Kerwin, D. (2006). Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35μm Triple-Well Process. 2006 IEEE Radiation Effects Data Workshop, 94–100. https://doi.org/10.1109/REDW.2006.295474

Chicago

Hartwell, M., K. Ryan, S. Netherton, P. Milliken, and D. Kerwin. 2006. “Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35μm Triple-Well Process.” 2006 IEEE Radiation Effects Data Workshop, January, 94–100. doi:10.1109/REDW.2006.295474.