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Study of Design Factors Affecting Turn-on Time of Silicon Controlled Rectifiers (SCRS) in 90 and 65nm Bulk CMOS Technologies.

Authors :
Di Sarro, J.
Chatty, K.
Gauthier, R.
Rosenbaum, E.
Source :
2006 IEEE International Reliability Physics Symposium Proceedings; 2006, p163-168, 6p
Publication Year :
2006

Details

Language :
English
ISBNs :
9780780394995
Database :
Complementary Index
Journal :
2006 IEEE International Reliability Physics Symposium Proceedings
Publication Type :
Conference
Accession number :
80835849
Full Text :
https://doi.org/10.1109/RELPHY.2006.251210